Whether you are in search of military and defense parts, aerospace parts, or other similar product solutions, Satellite To Submarine Parts is your one-stop shop. Thank you for your interest in part number 9042833-01, a Nanometrics Incorporated item that is listed alongside the description “Semiconductor Device Thyristor” and the NSN 5961013751418. To guarantee a swift procurement process for NSN part number 9042833-01, be sure to request a quote by filling out and submitting the RFQ form below, and one of our experts will offer a customized solution for your comparisons in response.
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We list everything with as much relevant information as possible to ensure that customers can swiftly identify and procure the exact products they need. For instance, while part number 9042833-01 is manufactured by Nanometrics Incorporated, it is specifically done so under CAGE Code 62055, a unique identifier assigned to a particular facility by the DLA that supplies to various government or defense agencies. Additionally, using the first digits of the NSN 5961-01-375-1418, one can also determine that this part falls under FSC 5961 Semiconductor Devices and Associated Hardware. Keeping this in mind, initiate the purchasing process today to see why so many customers depend on us for the NSN items they require.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-375-1418 Item PartTypeName: SEMICONDUCTOR DEVICE,THYRISTOR | 5961 | 013751418 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
9042833-01 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 0.330 INCHES MINIMUM AND 0.505 INCHES MAXIMUM |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/108 GOVERNMENT SPECIFICATION |
ABBH | INCLOSURE MATERIAL | METAL |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
THSD | THREAD SERIES DESIGNATOR | UNF |
ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT |
AXGY | MOUNTING METHOD | THREADED STUD |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.544 INCHES MINIMUM AND 0.562 INCHES MAXIMUM |
CRTL | CRITICALITY CODE JUSTIFICATION | NHCF |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 2.0 MAXIMUM FORWARD VOLTAGE,PEAK AND 3.0 MAXIMUM GATE TRIGGER VOLTAGE,DC |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 DEG CELSIUS AMBIENT AIR |
FEAT | SPECIAL FEATURES | HCI & ESD; JUNCTION PATTERN ARRANGEMENT: PNPN |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED CASE |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQX | CURRENT RATING PER CHARACTERISTIC | 16.00 AMPERES MAXIMUM AVERAGE ON-STATE CURRENT,180 DEGREES CONDUCTION ANGLE,AVERAGE OVER A FULL 60-HZ CYCLE |
SPCL | SPECIAL TEST FEATURES | SELECTED AND TESTED FOR APPLICATION IN RADIATION HARDNESS CRITICAL SYSTEMS |
TTQY | TERMINAL TYPE AND QUANTITY | 28 TAB,SOLDER LUG AND 1 THREADED STUD |
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