Part Number TS268EU with NSN 6625009236534 by Voron Electronics Corp - Request for Quote Now!

Part Number: TS268EU

Manufacturer: Voron Electronics Corp

NSN: 6625-00-923-6534

NIIN: 009236534

Item Name : Test Set Semiconduc

CAGE Code: 94518

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 00

Whether you are in search of military and defense parts, aerospace parts, or other similar product solutions, Satellite To Submarine Parts is your one-stop shop. Thank you for your interest in part number TS268EU, a Voron Electronics Corp item that is listed alongside the description “Test Set Semiconduc” and the NSN 6625009236534. To guarantee a swift procurement process for NSN part number TS268EU, be sure to request a quote by filling out and submitting the RFQ form below, and one of our experts will offer a customized solution for your comparisons in response.

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We list everything with as much relevant information as possible to ensure that customers can swiftly identify and procure the exact products they need. For instance, while part number TS268EU is manufactured by Voron Electronics Corp, it is specifically done so under CAGE Code 94518, a unique identifier assigned to a particular facility by the DLA that supplies to various government or defense agencies. Additionally, using the first digits of the NSN 6625-00-923-6534, one can also determine that this part falls under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Keeping this in mind, initiate the purchasing process today to see why so many customers depend on us for the NSN items they require.

Characteristics Data of NSN 6625-00-923-6534, 6625009236534

MRC	Criteria	Characteristic
ABRY	Length	8.187 INCHES NOMINAL
MRC	Decoded Requirement	Clear Text Reply
HGTH	Height	3.625 INCHES NOMINAL
AQXZ	Operating Test Capability	FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA
ABGL	Width	6.000 INCHES NOMINAL
AQXY	Test Type For Which Designed	FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL
ALSF	Internal Battery Accommodation	INCLUDED
ANPZ	Inclosure Feature	SINGLE ITEM W/CARRYING CASE